SITIS Archives - Topic Details
Program:  SBIR
Topic Num:  OSD10-A01 (OSD)
Title:  EO/Optical Protection
Research & Technical Areas:  Materials/Processes, Sensors

Acquisition Program:  
 The technology within this topic is restricted under the International Traffic in Arms Regulation (ITAR), which controls the export and import of defense-related material and services. Offerors must disclose any proposed use of foreign nationals, their country of origin, and what tasks each would accomplish in the statement of work in accordance with section 3.5.b.(7) of the solicitation.
  Objective:  Develop protection techniques against reverse engineering of Electro-Optical detectors and Optical components. Electro-Optical detectors and Optical components used in various military sensors and military equipment have designs and components that contain critical technology. Some of the components include IR Focal Plane Arrays (FPA) and Intensifier tubes used in Night Vision Goggles (NVG) or NV equipment. This SBIR effort involves detection of and protection against reverse engineering attacks on the optical design, laser couplers, and optical limiters.
  Description:  Adversaries may attempt to reverse engineer electro-optical detectors, such as IR FPAs or intensifier tubes, and optical components, such as laser couplers and optical limiters, to copy critical technology or to determine methods of countering military systems. Approaches need to be investigated that would prevent technology capture through examination of the physical structure of these critical components, characterization of operating bandwidths, or identification of physical components. Protection of military sensors and equipment is sought using a combination of techniques, including volume protection, tamper detection, and novel destruction methods. Participation in this SBIR is limited to US citizens.

  PHASE I: Research the feasibility of developing protection capabilities for electro-optical and optical components. Protection approaches must not significantly degrade system performance. Simulations, simple prototypes, and/or models may be used to demonstrate the feasibility of protecting optical systems. Offerer will describe the reverse engineering attack that the proposed protection technology counters, and estimate the impact upon system performance. Submit a final report to the government describing the proposed protection technology.
  PHASE II: Develop a prototype protection system for electro-optical or optical components based on the Phase I research. An independent lab is to test and evaluate the protection technology. Provide a copy of the test and evaluation report to the government. Deliver to the government point of contact two prototypes which are integrated in two components of interest. At the government’s facility, provide a two day on site seminar covering the protection technology. Provide the government point of contact with a final report.

  PHASE III DUAL USE APPLICATIONS: Department of Defense Directive (DOD) 5000.2R provides instructions on identifying critical technologies and on defining methods to protect them. Commercialization opportunities exist throughout the Defense Department and within the government agencies such as the Department of Homeland Security and Intelligence Community for technologies to protect critical technologies. Applications for a commercial version of the technology include protecting fiber optic communication systems, and optical computer networks.

  References:  1. D. Banks and C. Toumazou: “Reverse engineering the principal image processing architectures of the Macula Lutea within the human retina,” pp. 237 – 240, Nov. 2008. 2. A. Simoni, et al.: “Integrated optical sensors for 3-D vision,” Proceedings of IEEE Sensors, Vol. 1, pp. 1 – 4, June 2002. 3. E. Mei and D. Gallinger: “Optical system spectral transmission measurements in the visible and infrared,” IEEE Automatic Testing Conference, pp. 242 – 248, Sept. 1989. 4. W. Yong-gang, et al.: “High performance data acquisition system for IRFPA testing,” IEEE International Symposium on Circuits and Systems, pp. 2649 – 2652, May 2008. 5. T. Kelly, Jr.: “Advanced test equipment for third generation FLIRs,” IEEE AUTOTESTCON Proceedings Systems Readiness Technology Conference, 263 – 270, Aug. 2001.

Keywords:  Electo-Optics, Infrared, RF, Protection, Night Vision, Goggle, Hardware, FPA.

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